US Patent Issued to NEC on May 6 for "Deterioration diagnosis device, deterioration diagnosis method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., June 10 -- United States Patent no. 12,292,388, issued on May 6, was assigned to NEC Corp. (Tokyo).

"Deterioration diagnosis device, deterioration diagnosis method, and recording medium" was invented by Chisato Sugawara (Tokyo) and Kazuki Inagaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deterioration diagnosis device according to an example aspect of the present invention includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations include: acquiring an image including a portion to be diagnosed in a structure; calculating, by using the image, deterioration degree that is a degree of deterioration of the portion; calcul...