US Patent Issued to NEC on May 20 for "Projection transformation parameter estimation device, projection transformation parameter estimation method, and computer readable medium storing program thereof" (Japanese Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,692, issued on May 20, was assigned to NEC Corp. (Tokyo).

"Projection transformation parameter estimation device, projection transformation parameter estimation method, and computer readable medium storing program thereof" was invented by Gaku Nakano (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A projection transformation parameter for guaranteeing a deformation to a convex quadrilateral can be calculated even when one or more of correspondence points are errors. A projection transformation parameter estimation device according to an embodiment includes a correspondence point detection unit (1) configured to detect information about a corre...