US Patent Issued to NEC on May 13 for "Determining parameters of anchor boxes used in a sliding window method when a bounding box and a class of an object in an image are detected using a neural network and the sliding window method" (Japanese Inventor)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,299,950, issued on May 13, was assigned to NEC Corp. (Tokyo).

"Determining parameters of anchor boxes used in a sliding window method when a bounding box and a class of an object in an image are detected using a neural network and the sliding window method" was invented by Junichi Kamimura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A detection object analysis unit (4) is a parameter determination apparatus that determines parameters of a plurality of anchor boxes to be used in a sliding window method when a bounding box and a class of an object in an image are detected using a neural network and the sliding window method. The detection object...