US Patent Issued to NEC on March 25 for "Stress estimation device, stress estimation method, and recording media" (Japanese Inventor)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,257,074, issued on March 25, was assigned to NEC Corp. (Tokyo).

"Stress estimation device, stress estimation method, and recording media" was invented by Yoshifumi Onishi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The stress estimation device acquires the awakening degree of the subject and calculates the feature amount of the acquired awakening degree. The feature amount of the awakening degree is, for example, a ratio at which the temporal change of the awakening degree is within a predetermined range, information defining a histogram showing the distribution of the temporal change of the awakening degree, and the like. Then, the stress es...