US Patent Issued to NEC on March 25 for "Learning apparatus, learning method, inference apparatus, inference method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,330, issued on March 25, was assigned to NEC Corp. (Tokyo).

"Learning apparatus, learning method, inference apparatus, inference method, and recording medium" was invented by Azusa Sawada (Tokyo), Soma Shiraishi (Tokyo) and Takashi Shibata (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A learning apparatus includes a metric space learning unit and a case example storage unit. The metric space learning unit learns a metric space including feature vectors extracted from sets of attribute-attached image data for each combination of different attributes by using the sets of attribute-attached image data to which pieces of attribute information a...