US Patent Issued to NEC on March 18 for "Risk analysis result display apparatus, method, and computer readable medium" (Japanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,096, issued on March 18, was assigned to NEC Corp. (Tokyo).

"Risk analysis result display apparatus, method, and computer readable medium" was invented by Ryo Mizushima (Tokyo), Hirofumi Ueda (Tokyo) and Tomohiko Yagyu (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A comparison means compares a first risk analysis result with a second risk analysis result. The first risk analysis result includes a first risk evaluation value. The second risk analysis result includes a second risk evaluation value. Based on the result of the comparison, a display means displays the first risk evaluation value in such a manner that a first risk evaluation valu...