ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,681, issued on March 18, was assigned to NEC Corp. (Tokyo).
"Multi-modal test-time adaptation" was invented by Yi-Hsuan Tsai (Santa Clara, Calif.), Bingbing Zhuang (San Jose, Calif.), Samuel Schulter (New York), Buyu Liu (Cupertino, Calif.), Sparsh Garg (San Jose, Calif.), Ramin Moslemi (Pleasanton, Calif.) and Inkyu Shin (Daejeon, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are provided for multi-modal test-time adaptation. The method includes inputting a digital image into a pre-trained Camera Intra-modal Pseudo-label Generator, and inputting a point cloud set into a pre-trained Lidar Intra-modal Pseudo-label Ge...