ALEXANDRIA, Va., June 25 -- United States Patent no. 12,340,514, issued on June 24, was assigned to NEC Corp. (Tokyo).
"Rut detection for road infrastructure" was invented by Yi-Hsuan Tsai (Santa Clara, Calif.), Sparsh Garg (San Jose, Calif.), Manmohan Chandraker (Santa Clara, Calif.), Samuel Shulter (New York) and Vijay Kumar Baikampady Gopalkrishna (Santa Clara, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method for rut detection is provided. The method includes detecting, by a rut detection system, areas in a road-scene image that include ruts with pixel-wise probability values, wherein a higher value indicates a better chance of being a rut. The method further includes pe...