US Patent Issued to NEC on June 24 for "Data analysis apparatus, method, and computer readable method" (Japanese Inventor)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,925, issued on June 24, was assigned to NEC Corp. (Tokyo).

"Data analysis apparatus, method, and computer readable method" was invented by Florian Beye (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a data analysis apparatus including a time series analysis state memory unit configured to store a state of a time series data analysis; a time series analysis unit configured to analyze input data points belonging to time series data generated by a plurality of data sources and update the state stored the time series analysis state memory unit; and a filtering apparatus including: a data fetching unit configured to...