US Patent Issued to NEC on June 17 for "Meta imitation learning with structured skill discovery" (New Jersey, Pennsylvania Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,434, issued on June 17, was assigned to NEC Corp. (Tokyo).

"Meta imitation learning with structured skill discovery" was invented by Wenchao Yu (Plainsboro, N.J.), Wei Cheng (Princeton Junction, N.J.), Haifeng Chen (West Windsor, N.J.) and Yiwei Sun (State College, Pa.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for acquiring skills through imitation learning by employing a meta imitation learning framework with structured skill discovery (MILD) is presented. The method includes learning behaviors or tasks, by an agent, from demonstrations: by learning to decompose the demonstrations into segments, via a segmentation component, the segme...