US Patent Issued to NEC on July 15 for "Method, device and medium for diagnosing and optimizing data analysis system" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,361,288, issued on July 15, was assigned to NEC Corp. (Tokyo).

"Method, device and medium for diagnosing and optimizing data analysis system" was invented by Ni Zhang (Beijing), Xiaoyi Chen (Beijing) and Yang Zhao (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present disclosure provide method, device and computer storage medium for diagnosing and optimizing a data analysis system. The method disclosed herein comprises: obtaining information about an analysis engine in a data analysis system to be diagnosed and data to be diagnosed, the data to be diagnosed being associated with the analysis engine and comprising at least one...