ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,054, issued on July 15, was assigned to NEC Corp. (Tokyo).
"Inspection system" was invented by Shoji Yachida (Tokyo), Keiko Inoue (Tokyo), Azusa Sawada (Tokyo) and Toshinori Hosoi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system includes: a suspended matter detecting and tracking means that detects and tracks suspended matter present in the liquid in the container in chronological images obtained by consecutively imaging the liquid with a camera; a determining and storage controlling means that determines, based on a movement locus of the tracked suspended matter, whether the suspended matter is foreign matter or an air bub...