ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,235, issued on July 15, was assigned to NEC Corp. (Tokyo).
"Analysis device, analysis method, and storage medium" was invented by Shouhei Ohno (Tokyo), Takakazu Ishii (Tokyo), Nao Akagawa (Tokyo) and Hiromichi Hirata (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis device according to an aspect of the present disclosure includes: at least one memory configured to store instructions; and at least one processor configured to execute the instructions to: extract values of geospatial information at a plurality of points on a ground surface from a plurality of types of geospatial information, the plurality of types of geospatial informat...