US Patent Issued to NEC on July 1 for "Measurement control apparatus, measurement system, measurement control method, and non-transitory computer readable medium" (Japanese Inventor)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,820, issued on July 1, was assigned to NEC Corp. (Tokyo).

"Measurement control apparatus, measurement system, measurement control method, and non-transitory computer readable medium" was invented by Akira Tsuji (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement control apparatus (10) according to the present disclosure includes: a detection unit (11) configured to detect an abnormal part of point group data acquired from a three-dimensional optical sensor; a control unit (12) configured to control the orientation of the three-dimensional optical sensor in accordance with the abnormal part detected by the detection unit (11); and a de...