US Patent Issued to NEC on July 1 for "Deterioration diagnosis device, deterioration diagnosis method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,347,087, issued on July 1, was assigned to NEC Corp. (Tokyo).

"Deterioration diagnosis device, deterioration diagnosis method, and recording medium" was invented by Nana Jumonji (Tokyo), Maiko Hasegawa (Tokyo) and Yosuke Kimura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A deterioration diagnosis device according to the present invention includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations include: storing a history of deterioration degree in a portion to be diagnosed in a structure; calculating a deterioration speed of the portion based on the history; acquiring reference infor...