US Patent Issued to NEC on Jan. 27 for "System for supporting decision-making regarding assessment using a machine learning-trained model, assessment support method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,537,101, issued on Jan. 27, was assigned to NEC Corp. (Tokyo).

"System for supporting decision-making regarding assessment using a machine learning-trained model, assessment support method, and recording medium" was invented by Kenji Araki (Tokyo), Yutaka Uno (Tokyo), Junichi Yahara (Tokyo) and Kosuke Nishihara (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An assessment support system includes: an assessment prediction unit that predicts, based on patient information about a target patient who is a creation target for an assessment in a nursing record, an assessment vector obtained by vectorizing the assessment of the target patient, as a predic...