US Patent Issued to NEC on Jan. 27 for "Analysis condition generating apparatus, analysis system, analysis condition generating program, analysis program, analysis condition generating method, and analysis method" (Japanese Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,297, issued on Jan. 27, was assigned to NEC Corp. (Tokyo).

"Analysis condition generating apparatus, analysis system, analysis condition generating program, analysis program, analysis condition generating method, and analysis method" was invented by Junpei Kamimura (Tokyo), Kazuhiko Isoyama (Tokyo) and Yoshiaki Sakae (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An analysis condition for security risk for a data flow in a system to be analyzed is automatically generated. An analysis condition generating apparatus 1A generates from a natural sentence, using ontology in which a relationship is described between one or more nodes on a data flow...