ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,661, issued on Jan. 20, was assigned to NEC Corp. (Tokyo).
"Inspection apparatus" was invented by Keiko Inoue (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes a grasping unit configured to grasp a container in which a liquid is charged, an inclination unit configured to at least incline the container around a first axis with the grasping unit grasping the container, and a change unit configured to change an area of the container imaged by an imaging apparatus by changing relative orientations of the container and the imaging apparatus around a second axis different from the first axis."
The patent was filed on ...