ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,758, issued on Jan. 20, was assigned to NEC Corp. (Tokyo).
"Image analysis system and image analysis method" was invented by Jianquan Liu (Tokyo), Youhei Sasaki (Tokyo) and Yuta Namiki (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides an image analysis system (10) including: a plurality of image analysis units (11); a selection unit (12) that selects at least one of a plurality of the image analysis units (11); an analysis control unit (15) that causes the selected image analysis unit (11) to analyze an image specified by a user; and an output unit (17) that outputs an analysis result of the image."
The patent was...