US Patent Issued to NEC on Feb. 11 for "Inspection apparatus, measuring method, and computer readable medium for acquiring point cloud data of good quality in performing measurement of a member to be inspected using a three-dimensional sensor" (Japanese Inventor)

ALEXANDRIA, Va., Feb. 12 -- United States Patent no. 12,223,634, issued on Feb. 11, was assigned to NEC Corp. (Tokyo).

"Inspection apparatus, measuring method, and computer readable medium for acquiring point cloud data of good quality in performing measurement of a member to be inspected using a three-dimensional sensor" was invented by Akira Tsuji (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus (10) includes: a three-dimensional sensor (11) configured to irradiate a member to be inspected with a beam and acquire point cloud data of the member to be inspected based on at least amplitude information of light; a direction identifying unit (12) configured to identify a predetermin...