US Patent Issued to NEC on Feb. 10 for "Endoscopic examination support apparatus, endoscopic examination support method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,543,925, issued on Feb. 10, was assigned to NEC Corp. (Tokyo).

"Endoscopic examination support apparatus, endoscopic examination support method, and recording medium" was invented by Hiroyasu Saiga (Tokyo) and Tatsu Kimura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "In the endoscopic examination support apparatus, three three-dimensional model generation means generates a three-dimensional model of a luminal organ in which an endoscope camera is placed, based on endoscopic images acquired by imaging an interior of the luminal organ with the endoscope camera. The unobserved area detection means detects an area estimated not to be observed by th...