ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,490, issued on Dec. 30, was assigned to NEC Corp. (Tokyo).
"Inspection apparatus for inspecting a container" was invented by Shoji Yachida (Tokyo) and Michiaki Inoue (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus has: a gripping unit that grips a container filled with a liquid; a first lighting unit that emits light onto the liquid from one longitudinal end side of the container; and a second lighting unit that emits light onto the liquid from the other longitudinal end side of the container. The first lighting unit and the second lighting unit are arranged on a same side as an imaging device that acquires image data s...