US Patent Issued to NEC on Dec. 23 for "Imaging condition determination method, imaging condition determination system, imaging condition determination device, and computer readable medium" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,574, issued on Dec. 23, was assigned to NEC Corp. (Tokyo).

"Imaging condition determination method, imaging condition determination system, imaging condition determination device, and computer readable medium" was invented by Jiro Abe (Tokyo) and Yoshimasa Ono (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An imaging condition determination system according to the present disclosure includes: a reference data holding unit (101) configured to hold reference data representing a position of an object; an indication object holding unit (102) configured to hold an indication object representing a position of a target object on the reference data; ...