ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,269, issued on Aug. 26, was assigned to NEC Corp. (Tokyo).
"Image analyzing device and image analyzing method" was invented by Taichi Tanaka (Tokyo) and Osamu Hoshuyama (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "The image analyzing device calculates a phase difference image of a pair of images, calculates a phase difference between close pixels in the phase difference image, generates an evaluation function including a shooting time difference of the pair of images and taking a variable that is a displacement velocity difference of close pixels or an evaluation function including a baseline distance and taking a variable that is an elevat...