US Patent Issued to NEC on Aug. 12 for "Failure prediction system, failure prediction device, and failure prediction method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,805, issued on Aug. 12, was assigned to NEC Corp. (Tokyo).

"Failure prediction system, failure prediction device, and failure prediction method" was invented by Yutaka Yano (Tokyo), Hiroshi Kawakami (Tokyo) and Makoto Saitoh (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "In order to provide a mechanism which predicts a risk of future failure occurrence, by using fiber optic sensing, this failure prediction system comprises: a sensing function unit which acquires the environmental information detected by the optical fiber; an event classification function unit which classifies, by type, events occurring at each position of the object indicated...