ALEXANDRIA, Va., April 9 -- United States Patent no. 12,270,766, issued on April 8, was assigned to NEC Corp. (Tokyo).
"Inspection support apparatus, inspection support method, and computer-readable medium" was invented by Akira Tsuji (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection support apparatus (10) includes: an acquisition unit (11) configured to acquire information about specifications of a three-dimensional sensor, information about a shape and a planned placement position of each member to be inspected, and information about a planned installation position of the three-dimensional sensor; a simulation unit (12) configured to: calculate a distance between the planned placement pos...