US Patent Issued to ND-HI TECHNOLOGIES LAB, ETRON TECHNOLOGY on Oct. 14 for "Probe card system, method of manufacturing probe card system, method of using probe card system" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,835, issued on Oct. 14, was assigned to ND-HI TECHNOLOGIES LAB INC. (Taipei, Taiwan) and ETRON TECHNOLOGY INC. (Hsinchu, Taiwan).

"Probe card system, method of manufacturing probe card system, method of using probe card system" was invented by Ho-Ming Tong (Taipei, Taiwan) and Chao-Chun Lu (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe card system is provided. The probe card system, including a tester assembly, a probe head body configured to couple with the tester assembly, a first interconnection structure on a first side of the probe head body, and a probe layer structure on the first interconnection structure on the firs...