US Patent Issued to NCS TESTING TECHNOLOGY on June 10 for "Method for quantitatively characterizing dendrite segregation and dendrite spacing of high-temperature alloy ingot" (Chinese Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,434, issued on June 10, was assigned to NCS TESTING TECHNOLOGY Co. LTD (Beijing).

"Method for quantitatively characterizing dendrite segregation and dendrite spacing of high-temperature alloy ingot" was invented by Dongling Li (Beijing), Haizhou Wang (Beijing), Xuejing Shen (Beijing), Lei Zhao (Beijing), Wenyi Cai (Beijing), Mingbo Liu (Beijing), Zongxin Liu (Beijing) and Ya Peng (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for quantitatively characterizing a dendrite segregation and dendrite spacing of a high-temperature alloy ingot is disclosed. The method includes preparation and surface treatment of the high-temperature alloy...