US Patent Issued to NCS Testing Technology on Feb. 10 for "Integrated research and development system for high-throughput preparation and statistical mapping characterization of materials" (Chinese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,150, issued on Feb. 10, was assigned to NCS Testing Technology Co. LTD (Beijing).

"Integrated research and development system for high-throughput preparation and statistical mapping characterization of materials" was invented by Lei Zhao (Beijing), Haizhou Wang (Beijing), Lixia Yang (Beijing), Lei Yu (Beijing), Xuebin Chen (Beijing), Hui Wang (Beijing), Xuejing Shen (Beijing), Yunhai Jia (Beijing), Dongling Li (Beijing) and Xing Yu (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention discloses an integrated research and development system for high-throughput preparation and statistical mapping characterization of materials, ...