US Patent Issued to NAVER LABS on Sept. 30 for "Method for detecting reflectivity information of deep learning-based virtual environment point cloud data, and electronic device performing same" (South Korean Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,872, issued on Sept. 30, was assigned to NAVER LABS Corp. (Seongnam-si, South Korea).

"Method for detecting reflectivity information of deep learning-based virtual environment point cloud data, and electronic device performing same" was invented by Nam-il Kim (Seongnam-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device and an operational method thereof according to various embodiments relate to detection of reflectivity information of deep learning-based virtual environment point cloud data, and that is configured such that: image data and point cloud data are acquired; physical information including location inform...