US Patent Issued to NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY on Sept. 23 for "Measurement sensitivity calculation method, measurement sensitivity calculation device, recording medium storing measurement sensitivity calculation program, and optical measurement device" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,246, issued on Sept. 23, was assigned to NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY (Shizuoka, Japan).

"Measurement sensitivity calculation method, measurement sensitivity calculation device, recording medium storing measurement sensitivity calculation program, and optical measurement device" was invented by Masatsugu Niwayama (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a measurement target model representing a measurement target, this measurement sensitivity calculation device uses, as measurement sensitivity, an optical path length difference between a first optical path length indicating the length of an optical ...