US Patent Issued to National Technology & Engineering Solutions of Sandia on Sept. 23 for "Compact atom interferometry inertial navigation sensors with tailored diffractive optics" (New Mexico, Oklahoma Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,424,810, issued on Sept. 23, was assigned to National Technology & Engineering Solutions of Sandia LLC (Albuquerque, N.M.).

"Compact atom interferometry inertial navigation sensors with tailored diffractive optics" was invented by Jongmin Lee (Albuquerque, N.M.), Grant Biedermann (Norman, Okla.), Hayden James Evans McGuinness (Albuquerque, N.M.), Peter Schwindt (Albuquerque, N.M.) and Shanalyn A. Kemme (Albuquerque, N.M.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various optical systems for use in a light pulse atomic interferometer (LPAI)-based one-, two-, or three-axis accelerometer or gyroscope are disclosed. As an LPAI accelerometer or gyroscop...