US Patent Issued to National Technology & Engineering Solutions of Sandia on Aug. 19 for "Measurement protocol for large dynamic range and high sensitivity of an evanescent-field-mode guided atom interferometer" (New Mexico Inventors)

ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,611, issued on Aug. 19, was assigned to National Technology & Engineering Solutions of Sandia LLC (Albuquerque, N.M.).

"Measurement protocol for large dynamic range and high sensitivity of an evanescent-field-mode guided atom interferometer" was invented by Jongmin Lee (Albuquerque, N.M.), Weng W. Chow (Albuquerque, N.M.), Adrian Samuel Orozco (Albuquerque, N.M.) and Jonathan David Sterk (Albuquerque, N.M.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A large-dynamic and high-sensitive measurement protocol of an evanescent-field-mode guided atom interferometer accelerometer is disclosed. Cold atoms of a finite temperature are one-dimensionally guid...