US Patent Issued to National Space Science Center, Chinese Academy of Sciences on Nov. 18 for "Method and device for single event effect testing of large capacity solid state drives based on high-energy particles" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,392, issued on Nov. 18, was assigned to National Space Science Center, Chinese Academy of Sciences (Beijing).

"Method and device for single event effect testing of large capacity solid state drives based on high-energy particles" was invented by Yingqi Ma (Beijing) and Tian Yu (Hohhot, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and a device for single event effect testing of large capacity solid state drives based on high-energy particles are provided. The testing method includes: performing a solid state drive (SSD) user data preset experiment; performing irradiation testing using the device; detecting errors of single event latc...