US Patent Issued to National Instruments on July 29 for "Combining signals transmitted from multiple probe antennas in over-the-air antenna measurements" (German Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,375,188, issued on July 29, was assigned to National Instruments Corp. (Austin, Texas).

"Combining signals transmitted from multiple probe antennas in over-the-air antenna measurements" was invented by Thomas Deckert (Dresden, Germany), Martin Obermaier (Dresden, Germany) and Dirk Plettemeier (Dresden, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array transmitter is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the transmitter transmits a near-field (NF) over-the-air (OTA) signal to the AUT. An alignment p...