US Patent Issued to NATIONAL INSTITUTE OF METROLOGY, CHINA on Sept. 23 for "Ion storage system and method based on quadrupole-ion trap tandem mass spectrometry" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,424,430, issued on Sept. 23, was assigned to NATIONAL INSTITUTE OF METROLOGY, CHINA (Beijing).

"Ion storage system and method based on quadrupole-ion trap tandem mass spectrometry" was invented by Shiying Chu (Beijing), You Jiang (Beijing), Xiang Fang (Beijing), Zejian Huang (Beijing), Xinhua Dai (Beijing), Yuting An (Beijing) and Di Zhang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to the technical field of mass spectra. Disclosed are a novel ion storage system and method based on a quadrupole-ion trap tandem mass spectrometry. The system sequentially comprises a heating capillary, a tube lens, a skimmer, a fi...