US Patent Issued to NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY on March 25 for "Optical measurement device and measurement method" (Japanese Inventor)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,473, issued on March 25, was assigned to NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (Japan).

"Optical measurement device and measurement method" was invented by Hidemi Tsuchida (Tsukuba, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical measurement device and an optical measurement method that can accurately measure a distance and a velocity by removing an influence of a nonlinear chirp of a laser in FMCW LiDAR. The optical measurement device includes a laser that outputs light of which a frequency is modulated; a photodetector; a heterodyne optical system that splits output light of the laser into two components...