US Patent Issued to NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY on Jan. 27 for "Optical measurement device and measurement method" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,566, issued on Jan. 27, was assigned to NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (Japan).

"Optical measurement device and measurement method" was invented by Hidemi Tsuchida (Tsukuba, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical measurement device includes at least a multi-frequency laser configured to simultaneously generate a frequency-fixed carrier and at least one frequency-modulated subcarrier, an optical branching element, a dual frequency beat signal generator, a difference signal generator, and an arithmetic processing unit. Either the carrier or the subcarrier within the output light of the multi-f...