US Patent Issued to NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY on Sept. 23 for "Accurate temperature measurement structure of wide temperature range and method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,309, issued on Sept. 23, was assigned to NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY (Taoyuan, Taiwan).

"Accurate temperature measurement structure of wide temperature range and method thereof" was invented by Shiang-Feng Tang (Taoyuan, Taiwan), Shun-Lung Yen (Taoyuan, Taiwan), Kuo-Jen Chang (Taoyuan, Taiwan) and Hsin-Chang Chen (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An accurate temperature measurement structure of a wide temperature range includes: a lens set; an optical base, having a neutral density slot and being fixed with the lens set by a first screw; a mask shutter assembly, fixed with the optical base b...