ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,383,186, issued on Aug. 12, was assigned to National Applied Research Laboratories (Taipei, Taiwan).
"Electroencephalogram measurement structure" was invented by Chun-Ming Huang (Hsinchu, Taiwan), Chen-Chia Chen (Hsinchu, Taiwan), Gang-Neng Sung (Hsinchu, Taiwan) and Chien-Ming Wu (Tainan, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides an electroencephalogram measurement structure formed by an ear-hanging structure and a second circuit board. The ear-hanging structure includes a body. An ear-hanging member is disposed at the extension of the body. The body can be worn on the ear via the ear-hanging member. In additi...