US Patent Issued to Nanyang Technological University on Oct. 28 for "Apparatus and method for measuring an embedded object" (Singaporean Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,361, issued on Oct. 28, was assigned to Nanyang Technological University (Singapore).

"Apparatus and method for measuring an embedded object" was invented by Zheng Fan (Singapore) and Haihan Sun (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure generally relates to an apparatus (100) and method for measuring an object (200) embedded in a structure (210). The apparatus (100) comprises: a first antenna (110a) and a second antenna (110b) with respective perpendicular and parallel polarizations; a measurement instrument (120); and a control system (130). The measurement instrument (120) transmits and measures radio signals...