US Patent Issued to Nanyang Technological University on Aug. 12 for "Monitoring system and method of identification of anomalies in a 3D printing process" (Singaporean Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,383,958, issued on Aug. 12, was assigned to Nanyang Technological University (Singapore).

"Monitoring system and method of identification of anomalies in a 3D printing process" was invented by Anh Tuan Tran (Singapore), Ngoc Vu Nguyen (Singapore), Jun Wee Allen Hum (Singapore), Chee How Wong (Singapore) and Qingyang Lu (Singapore).

According to the abstract* released by the U.S. Patent & Trademark Office: "A monitoring system for in-situ identification of anomalies of a workpiece in a 3D printing manufacturing process is provided. The monitoring system includes an optical sensor having an optical path; an infrared sensor having an IR path; an optical device configured to merge the op...