ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,157, issued on Sept. 16, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).
"System and method for testing memory device" was invented by Jui-Chung Hsu (Taoyuan, Taiwan), Wei Chuan Chen (Taipei, Taiwan) and Wan-Chun Fang (Taoyuan, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system including memory devices and a tester is provided. The tester is configured to: generate a first multi-purpose command to the memory devices and a first data signal to each of a first group in the memory devices to store a first identity; generate a second multi-purpose command to the memory devices and the first data signal to each of a second group...