US Patent Issued to NANYA TECHNOLOGY on Oct. 7 for "Measuring method for measuring overlay shift and non-transient computer readable storage medium" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,469, issued on Oct. 7, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).

"Measuring method for measuring overlay shift and non-transient computer readable storage medium" was invented by Chun Yen Wei (Taipei, Taiwan) and Tsu-Wen Huang (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measuring method for measuring an overlay shift between two wafers, comprising: providing a previous wafer layer, a to-be-measured wafer layer and a measuring circuit layer, wherein each of the previous wafer layer and the to-be-measured wafer layer comprises a first group of dies; measuring, by a plurality of probes of the measuring circuit la...