US Patent Issued to NANYA TECHNOLOGY on Oct. 21 for "Testing system for integrated circuit device, and signal source and power supplying apparatus" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,479, issued on Oct. 21, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).

"Testing system for integrated circuit device, and signal source and power supplying apparatus" was invented by Chung-Wei Huang (Taoyuan, Taiwan), Wei-Te Shen (Taoyuan, Taiwan), Chia-Ping Liao (New Taipei, Taiwan) and Kai-Li Liu (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present application discloses a testing system for integrated circuit device, and signal source and power supplying apparatus. The signal source provides a plurality of supply voltages and a programmable voltage to a plurality of semiconductor chip groups. The signal source ...