US Patent Issued to NANYA TECHNOLOGY on Nov. 4 for "Memory device test system" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,894, issued on Nov. 4, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).

"Memory device test system" was invented by Yi-Kai Huang (Taoyuan, Taiwan), Hung-Kai Chan (Taoyuan, Taiwan) and Ting Hsuan Lin (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory device test system includes a memory device, a tester, a system board, and an interface card. The tester generates a first control signal corresponding to a test being performed to the memory device. The system board is coupled to the tester and generates, in response to the first control signal, a second control signal to the memory device. The interface card is coupled ...