ALEXANDRIA, Va., June 16 -- United States Patent no. 12,308,086, issued on May 20, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).
"System and method for testing memory device" was invented by Jui-Chung Hsu (Pingtung County, Taiwan) and Wan-Chun Fang (Taoyuan, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system is provided. The system comprises a memory device and a test device. The test device that is operatively coupled to the memory device and transmits a plurality of glitch signals and a plurality of control signals after the plurality of glitch signals for a write operation of the memory device according to a data signal. The test device determines, based on write data of the dat...