US Patent Issued to NANYA TECHNOLOGY on June 24 for "Fault analysis device and fault analysis method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,732, issued on June 24, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).

"Fault analysis device and fault analysis method thereof" was invented by Chien Yu Chen (New Taipei, Taiwan) and Meng-Kai Hsieh (Nantou County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A fault analysis device and a fault analysis method of the fault analysis device are provided. A sensing circuit senses a first distorted signal on a first signal transmission path of an abnormal signal device when the abnormal signal device performs a preset operation. A signal generating circuit provides a fault test signal to a second signal transmission path of a stan...