ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,396, issued on July 29, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).
"Test system and method" was invented by Chien Yu Chen (New Taipei, Taiwan) and Meng-Kai Hsieh (Nantou County, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a test system and method. The test system is configured to analyze a system platform and includes a data collector and a test monitor. The data collector is configured to receive a signal transmitted between a controller and a memory of the system platform and is configured to process the signal to generate a processed signal. The test monitor is configured to encode the p...