US Patent Issued to NANYA TECHNOLOGY on Feb. 4 for "Memory testing system and memory testing method" (Taiwanese Inventor)

ALEXANDRIA, Va., Feb. 5 -- United States Patent no. 12,217,815, issued on Feb. 4, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan).

"Memory testing system and memory testing method" was invented by Chien Yu Chen (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a memory testing system, including at least one memory device, a power supply, and a processor. The power supply is configured to provide a first reference voltage to the at least one memory device according to a control signal. The processor is configured to provide the control signal to control the power supply to vary the first reference voltage among multiple voltage levels and test the a...